General EEEMCal Meeting Summary 9/8/23

PARTICPANTS: Carlos, Hamlet, Joerg, Josh, Larry, Tanja, Ioana, Cristiano, Crytur-USA, Yeran, Sasha, Vardan, Hrachya

READOUT ASICS/DISCRETE

• Discrete

• Justin contacted Gerard Visser by email but no specifics yet on giving us some equipment or whether he would like to some testing with some SiPM's/FEB that we give him

• ASICS

• ongoing
• make PCB for the SiPMs, pins of new 6x6 mm^2 very delicate, two SMS connectors planned

DISCUSSION CHOICE OF SIPM

• Tradeoff pixel pitch and dynamic range - resolution and linearity

• Crytur-USA modeled different SiPM characteristics and found a difference in Photo detection efficiency: PDE at wavelength of emission peak crystal: 10um ~18% PDE and 15um ~32% PDE
• The photostatistics is most important at low energies

• Limitation to resolution may not only be photostatistics, however. At higher energies dominated by the constant term and that is dominated by linearity.

• EIC data will mostly be at GeV scale, e.g., > 1 GeV. There, linearity is very important.

• In the end, it would be good to have beam test results for the different SiPMs (10/15u pixel pitch, 3mmx3mm and 6mmx6mm sizes)

• Crytur-USA has results from JLab for 15um
• Crytur-USA has some low energy beam test results for 10um - may be able to share the results at the next meeting

• For the review: emphasize the linearity as EIC data at GeV scale

• For the review slides:

• page2: make consistent the numbers in the table with those in the text on the slide
• somewhere should mention the SiPM temperature dependence and radiation hardness

DISCUSSION DEVELOPMENT PCBA FOR THE SIPMS

• Development of a PCB for 6x6mm2 SiPMs

• The larger 6mmx6mm SiPMs have higher capacitance - need new PCBAs to deal with that and to still fit into 100-200ns

• Also need to consider that one needs to put together multiple SiPMs, which further increases capacitance

• Developments ongoing at IJCLab-Orsay, INFN, JLAB, and Crytur-USA

MECHANICAL DESIGN

• Work on thermal studies ongoing - prototype tests

NEXT MEETING: 22 SEPTEMBER AT 8AM ET